3.7.4.2 - Parallel Plate Capacitor

3.7.4.2 - Parallel Plate Capacitor

Relate capacitance to plate geometry and dielectric material, explain molecular polarisation, and distinguish a capacitor connected to a battery from one isolated after charging.

Plate geometry and electric field

A parallel-plate capacitor has two flat conducting plates with overlapping area AA, separated by an insulating gap of width dd. One plate carries +Q+Q and the other −Q-Q. Here AA is the overlapping area of one plate, not the sum of both plate areas.

[DIAGRAM: asset_name: 7.4.2 - Parallel Plate Capacitor - Diagram 1; asset_slug: 7.4.2 - Parallel Plate Capacitor - Diagram 1; caption: Parallel conducting plates of overlapping area A and separation d. The field points from the positive plate to the negative plate, the cell polarity matches the plate charges.; description: Parallel conducting plates of overlapping area A and separation d. The field points from the positive plate to the negative plate, the cell polarity matches the plate charges.]
Parallel conducting plates of overlapping area A and separation d. The field points from the positive plate to the negative plate, the cell polarity matches the plate charges.

When the separation is small compared with the plate dimensions, the field away from the edges is approximately uniform. Then E=V/dE=V/d. Fringing at the edges makes the ideal model less accurate for widely separated or poorly aligned plates. Plate charge flows through the connecting wires; an intact dielectric does not conduct electrons from plate to plate.

How area, spacing and material set capacitance

Increasing the overlapping plate area allows more charge at a given pd; reducing the separation also increases capacitance. For parallel plates completely filled by a uniform dielectric,

Parallel-plate capacitance

C=ε0εrAd.C=\frac{\varepsilon_0\varepsilon_r A}{d}.

The permittivity of free space is ε0=8.85×10−12 F m−1\varepsilon_0=8.85\times10^{-12}\,\mathrm{F}\,\mathrm{m}^{-1}. Relative permittivity εr\varepsilon_r is dimensionless; it is 1 in vacuum and approximately 1 in air. The equation assumes negligible edge effects and no air gaps in the dielectric.

For vacuum, the uniform-field relation E=Q/(ε0A)E=Q/(\varepsilon_0 A), together with V=EdV=Ed, gives C=Q/V=ε0A/dC=Q/V=\varepsilon_0 A/d. The factor εr\varepsilon_r describes the increase produced by the dielectric. Thus doubling AA doubles CC, whereas doubling dd halves it. Doubling a square plate's side length quadruples its area. Thin dielectric layers and large folded or rolled electrode areas allow large capacitance in a small volume.

For square plates of side 0.25 m0.25\,\mathrm{m}, separation 1.5 mm1.5\,\mathrm{mm} and εr=2.3\varepsilon_r=2.3, use A=0.0625 m2A=0.0625\,\mathrm{m^2} and d=1.5×10−3 md=1.5\times10^{-3}\,\mathrm{m}. This gives

C=8.85×10−12×2.3×0.06251.5×10−3=8.48×10−10 F≈0.85 nF.C=\frac{8.85\times10^{-12}\times2.3\times0.0625}{1.5\times10^{-3}}=8.48\times10^{-10}\,\mathrm{F}\approx0.85\,\mathrm{nF}.

Relative permittivity and its measurement

Relative permittivity, also called the dielectric constant in this context, is the ratio of a material's permittivity to that of free space. For the same plate geometry,

εr=εε0=CC0.\varepsilon_r=\frac{\varepsilon}{\varepsilon_0}=\frac{C}{C_0}.

Here CC is the fully dielectric-filled capacitance and C0C_0 is the vacuum capacitance (approximated by air). A dielectric constant of 7.0 means seven times the capacitance for the same geometry. It also means seven times the plate charge at the same pd, since Q/Q0=C/C0Q/Q_0=C/C_0. The charge ratio is invalid if the pd changes.

To determine εr\varepsilon_r, measure capacitance using a capacitance meter with air between two plates, then insert a sheet filling the same gap. Keep overlapping area and separation fixed; measure sheet thickness or use spacers, because inserting a thicker sheet would change two variables. Subtract a measured lead/stray capacitance if significant, then calculate C/C0C/C_0. For corrected readings C0=82 pFC_0=82\,\mathrm{pF} and C=205 pFC=205\,\mathrm{pF}, εr=2.50\varepsilon_r=2.50. Air pockets lower the measured increase.

The same apparatus can investigate C∝AC\propto A at fixed dd, or C∝1/dC\propto1/d at fixed AA. Measure several spacings; plot CC against 1/d1/d, keeping leads in the same position and plates parallel. A straight line through the origin after stray-capacitance correction supports the model. Its gradient is ε0εrA\varepsilon_0\varepsilon_r A; a nonzero intercept can indicate uncorrected stray capacitance.

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